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| Sprint
4510 Flying Prober |
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Features |
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>
Introduction
> Features
> Specification
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Superior
Design & Engineering
Superior probing precision and repeatability of results is
ensured by the tester's advanced design. Boards are placed on
an integrated, automatically adjusting, conveyor that securely
aligns and clamps them in place. Board coordinates are
captured and automatically adjusted for initial orientation
errors by a fiducial camera. |
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Sprint
4510 has four equal length probes that travel independently,
in the same plane, above the board under test. Each probe is
moved by a surface linear motor. |
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Furthermore,
all areas of the board are equally accessible by every probe.
Probe movement is optimized and controlled to maintain maximum
safety and reliability while yielding high test through-put.
These factors guarantee faster test times, improved fault
coverage and lower cost. |
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An
advanced probe assembly design contributes to the tester's
high speed, precision, and repeatability. As the probes travel
rapidly over the board, they automatically adjust their x, y,
and z positions. |
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The effect
of board warpage is mitigated by the 6 degree angle of the
probes. A programmable z-axis stroke optimizes probing to the
height and force requirements of the board. |
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High
Fault Coverage
With an x, y, positioning accuracy of ±0.4 mil (±10um),
Sprint 4510 can access nodes inaccessible to bed-of-nails
fixtures. A vertical probe angle of 6 degrees minimizes
"dead zones" caused by taller neighboring components
and reduces the possibility of probing the wrong position on a
warped board.
Extended measurement ranges and better stability is achieved
by dual wiring from the analog measurement unit to each probe
head. In addition to connectors and polarized capacitors, ICs
including BGAs and those with heat sinks can be tested for
shorts and opens using vectorless test techniques, namely
DeltaScan and FrameScan.
DeltaScan uses protection (parasitic) diodes built into many
devices to test failing pins. One stationary probe is required
per power supply node. Probing can be run on the solder side
of the board, which generally provides greater node
accessibility.
FrameScan uses a capacitive coupling technique to check for
open pins on ICs that have no diodes. It can also be used to
test for opens and shorts on connectors and for proper
orientation of polarized capacitors. The probe assembly
includes four retractable capacitive sensors.
Vision Test automatically inspects for the presence and
orientation of ICs and provides coverage for electrically
non-testable components such as bypass capacitors. |
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Power
Supplies
Sprint 4510 can also be fitted with a series of integrated
programmable power supplies to power up assemblies under test.
The machine software can rely on a standard protocol such as
IEEE-488 to control the power supplies and turn them on and
off during test flow. |
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Boundary
Scan Test
If equipped with the power supply option, Sprint 4510 can host
Acculogic boundary scan controllers to perform boundary scan
tests on the target. Combining flying probe and boundary scan
test will provide higher fault coverage during production,
thereby isolating defects that each test strategy, if used by
itself, would not detect successfully. |
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High
Throughput
With a three phase surface linear motor moving each probe and
intelligent driver software, the Sprint 4510 can deliver
higher speed and accuracy than competing flying probe testers.
Measurement time is at fact as 50 milliseconds per test step
in tandem measurement mode. The equal accessibility, by the
four probes, to all board locations means that the
head-assignment algorithms can optimize testing with no
mechanical limitations, and decreasing probe deterioration.
Board clamping, placement, and movement through the tester are
optimized, Down time during line change over is eliminated
with the Automatic data loading and conveyor adjustment
capability. A bar-code reader and off-line repair software are
available as options.
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Click here for more spec ... |
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