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| ESI-2002
In-Circuit Tester |
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Specification |
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>
Introduction
> Features
> Specification
> Overall Dimensions
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Test Node |
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Standard 256 nodes.
Expandable in increments of 128 nodes up to maximum of 2048 nodes. |
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Scanner
Board |
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128
Pins/Board |
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1
Open Short Test |
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Threshold
Level |
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4
Ohm ~ 39.99 M Ohm |
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Testing
Time |
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900
mS/500 pin |
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2
Component Test |
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Test
Step |
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16,000
steps |
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Testing
Time |
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3
~ 25 mS/step |
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Resistance |
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0.1
ohm ~ 39.99 M Ohm |
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Low
Resistance |
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20
m Ohm ~ 399.9 Ohm |
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Capacitance |
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10
pF ~ 39.99 mF |
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Inductance |
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10
uH ~ 39.99 H |
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Diode
/ Transistor |
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Vf
= 0.1 V ~ 39.99 V |
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Zener
Diode |
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Vz
= 0.1 V ~ 39.99 V , ~90V (Option) |
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Digital
Transistor |
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Bias
= 5V On/Off |
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Opto
Coupler |
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Bias
= 5V On/Off |
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Jumper
Wire |
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4
Ohm ~ 39.99 M Ohm |
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IC,
CN Short |
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4
Ohm ~ 39.99 M Ohm |
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DC
Voltage |
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0
~ ± 39.99V |
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Guarding |
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10
points (max.) |
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Pass
/ Fail Tolerance |
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1%
~ 999%, -100% or Absolute Value |
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Pin
Contact Check |
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Non
Program |
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3
Regular Specifications |
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Power
Supply |
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AC
90V ~ 260V, 500VA, 50/60Hz |
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Air |
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0.4
~ 0.6 MPa |
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Environment |
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10°C
~ 35°C 20% ~ 80% |
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Dimensions |
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ESI-2002
: 1080 (W) x 705 (D) x 1395 (H) mm |
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ESI-2002ST
: 620 (W) x 780 (D) x 1655 (H) mm |
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Personal
Computer |
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DOS
/V PC |
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Operation
PC |
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Windows2000/
XP |
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4
Fixture |
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Fixture
Size |
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500
(W) x 315 (D) x 150 (H) mm |
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B.U.T.
Size |
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420
(W) x 290(D) x 100 (H) mm |
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Require
Size |
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Option |
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5
Option |
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High
Voltage Zener |
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Max.
90V 10mA |
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Relay
test |
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Max.
48V 50mA |
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Delta
Scan |
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Digital
IC Lead Open |
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Frame
Scan |
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IC
& CN Lead Open |
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Function
Test |
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V,
I, f, T, Delta t |
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Specification Subject To
Change Without Notice |
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